Ling-wu Chen: шукати на сайті Z-Library

Найбільша колекція наукових статей у сіті. 70,000,000+ безкоштовних статей.

Пожертвування 15 вересня 2024 – 1 жовтня 2024

Z-Library - одна з найбільших онлайн-бібліотек у світі, в якій зберігається більше 17,000,000 книг та 84,837,000 статей. Ми намагаємось зробити літературу доступною кожному. Сьогодні (15 вересня 2024) ми відкриваємо додатковий збір пожертвувань на підтримку та розвиток проекту.

Також БЕЗЛІМТНІ завантаження (протягом 31 дня після завершення пожертвування) доступні для ВСІХ користувачів, які підтримають проект в період збору коштів до 1 жовтня 2024.

Про збір коштів Детальніше

Підтримати

Книги
Статті (53)
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Etch Defect Characterization and Reduction in Hard-Mask-Based Al Interconnect Etching

Lee, Hong-Ji, Hung, Che-Lun, Leng, Chia-Hao, Lian, Nan-Tzu, Young, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

Журнал:

International Journal of Plasma Science and Engineering

Рік:

2008

Мова:

english

Файл:

PDF, 1.64 MB

english, 2008

Mechanisms and solutions to gate oxide degradation in flash memory by tunnel-oxide nitridation engineering

Szu-Yu Wang,, Chih-Yuan Chin,, Pei-Ren Jeng,, Ling-Wu Yang,, Ming-Shiang Chen,, Chi-Tung Huang,, Jeng Gong,, Kuang-Chao Chen,, Ku, J., Chih-Yuan Lu,

Журнал:

IEEE Electron Device Letters

Рік:

2005

Мова:

english

Файл:

PDF, 621 KB

english, 2005

[IEEE 2014 20th International Conference on Ion Implantation Technology (IIT) - Portland, OR, USA (2014.6.26-2014.7.4)] 2014 20th International Conference on Ion Implantation Technology (IIT) - A study of surface condensation defect improvement after cryogenic implantation

Yu-Min Lin,, Jung-Yi Guo,, Jeng-Hwa Liao,, Hsin-Ju Lin,, Jung-Yu Hsieh,, Ling-Wu Yang,, Tahone Yang,, Kuang-Chao Chen,, Chih-Yuan Lu,

Рік:

2014

Мова:

english

Файл:

PDF, 986 KB

english, 2014

Improvement of cell reliability by floating gate implantation on 1Xnm NAND flash memory

Liao, Jeng-Hwa, Ko, Zong-Jie, Lin, Yu-Min, Lin, Hsing-Ju, Hsieh, Jung-Yu, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

Журнал:

Solid-State Electronics

Рік:

2018

Мова:

english

Файл:

PDF, 2.28 MB

english, 2018

[IEEE 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design - Opio, France (2008.05.18-2008.05.22)] 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design - A Study of Sub-40nm FinFET BE-SONOS NAND Flash

Hsu, Tzu-Hsuan, Lue, Hang-Ting, Peng, Wu-Chin, Tsai, Cheng-Hung, King, Ya-Chin, Wang, Szu-Yu, Wu, Ming-Tsung, Hong, Shih-Ping, Hsieh, Jung-Yu, Yang, Ling-Wu, Lian, Nan-Tzu, Yang, Tahone, Chen, Kuang-C

Рік:

2008

Мова:

english

Файл:

PDF, 796 KB

english, 2008

Study of charge trapping characteristics of SONOS with various trapping layers using gate-sensing and channel-sensing (GSCS) method

Liao, Jeng-Hwa, Lin, Hsing-Ju, Lue, Hang-Ting, Du, Pei-Ying, Hsieh, Jung-Yu, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

Журнал:

Solid-State Electronics

Рік:

2013

Мова:

english

Файл:

PDF, 1.55 MB

english, 2013

[IEEE 2010 21st Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - San Francisco, CA, USA (2010.07.11-2010.07.13)] 2010 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Robust shallow trench isolation technique used for 75nm nor flash memory

Liao, Jeng-Hwa, Wei, Kuo-Liang, Lee, Hong-Ji, Cheng, Chun-Min, Chiang, Chun-Ling, Hsieh, Jung-Yu, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

Рік:

2010

Мова:

english

Файл:

PDF, 1.60 MB

english, 2010

[IEEE 2013 e-Manufacturing & Design Collaboration Symposium (eMDC) - Hsinchu, Taiwan (2013.9.6-2013.9.6)] 2013 e-Manufacturing & Design Collaboration Symposium (eMDC) - FOUP N2 purge engineering in Fab

Yiting Kuo,, Howard Tsao,, Tuung Luoh,, Ling-Wu Yang,, Tahone Yang,, Kuang-Chao Chen,, Chih-Yuan Lu,

Рік:

2013

Мова:

english

Файл:

PDF, 955 KB

english, 2013

[IEEE 2012 e-Manufacturing & Design Collaboration Symposium (eMDC) - HsinChu, Taiwan (2012.09.4-2012.09.4)] 2012 e-Manufacturing & Design Collaboration Symposium (eMDC) - FOUP environment control and condense reduction

Kuo, Yiting, Tsao, Howard, Luoh, Tuung, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

Рік:

2012

Мова:

english

Файл:

PDF, 392 KB

english, 2012

[IEEE 2010 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2010.06.15-2010.06.17)] 2010 Symposium on VLSI Technology - A highly scalable 8-layer 3D vertical-gate (VG) TFT NAND Flash using junction-free buried channel BE-SONOS device

Lue, Hang-Ting, Hsu, Tzu-Hsuan, Hsiao, Yi-Hsuan, Hong, S. P., Wu, M. T., Hsu, F. H., Lien, N. Z., Wang, Szu-Yu, Hsieh, Jung-Yu, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Hsieh, Kuang-Yeu, Lu, Chi

Рік:

2010

Мова:

english

Файл:

PDF, 1.92 MB

english, 2010

Silica Hybrid Containing (R)-2,2′-Binaphtho-20-crown-6 Moieties via the Sol-Gel Process

Cheng, Yi-Xiang, Liu, Tian-Dong, Chen, Ling-Wu

Журнал:

Chinese Journal of Chemistry

Рік:

2003

Мова:

english

Файл:

PDF, 298 KB

english, 2003

Effect of fabrication process on the charge trapping behavior of SiON thin films

Szu-Yu Wang, Hang-Ting Lue, Erh-Kun Lai, Ling-Wu Yang, Jeng Gong, Kuang-Chao Chen, Kuang-Yeu Hsieh, Joseph Ku, Chih-Yuan Lu

Журнал:

Solid-State Electronics

Рік:

2006

Мова:

english

Файл:

PDF, 153 KB

english, 2006

Analysis of long-term survival in patients with localized renal cell carcinoma: laparoscopic versus open radical nephrectomy

Jun-Hang Luo, Fang-Jian Zhou, Dan Xie, Zhi-Ling Zhang, Bing Liao, Hong-Wei Zhao, Yu-Ping Dai, Ling-Wu Chen, Wei Chen

Журнал:

World Journal of Urology

Рік:

2010

Мова:

english

Файл:

PDF, 164 KB

english, 2010

Comparison of surgical stress response to laparoscopic and open radical cystectomy

Sheng-zheng Wang, Yu Chen, Huan-yi Lin, Ling-wu Chen

Журнал:

World Journal of Urology

Рік:

2010

Мова:

english

Файл:

PDF, 237 KB

english, 2010

Hand-assisted laparoscopic radical cystectomy and extracorporeal urinary diversion: Experience with 31 cases

Sheng-zheng Wang, Ling-wu Chen, Wei Chen, Yong-hai Zhang

Журнал:

International Journal of Urology

Рік:

2008

Мова:

english

Файл:

PDF, 71 KB

english, 2008

Hand-assisted versus pure laparoscopic radical cystectomy: A clinical outcome comparison

Sheng-zheng Wang, Ling-wu Chen, Wei Chen, Jun-xing Chen, Huan-yi Lin

Журнал:

International Journal of Urology

Рік:

2009

Мова:

english

Файл:

PDF, 73 KB

english, 2009

Long-term sexual activity status and influencing factors in men after surgery for hypospadias

Wang, Wen-Wei, Tu, Xiang-An, Deng, Chun-Hua, Mo, Jia-Cong, Zhao, Liang, Chen, Ling-Wu

Журнал:

Asian Journal of Andrology

Рік:

2009

Мова:

english

Файл:

PDF, 360 KB

english, 2009

Construction of a recombinant eukaryotic expression plasmid containing human PDLIM2 gene and its biological activity

Jun Xiao, Ling-Wu Chen, Jun-Xing Chen, Huan-Yi Lin, Bin Huang

Журнал:

Plasmid

Рік:

2011

Мова:

english

Файл:

PDF, 313 KB

english, 2011

Improving the Endurance of Nonvolatile Flash Memory Using Micro-Grain Poly-Silicon Floating Gate

Tuung Luoh, Ling-Wu Yang, Tahone Yang, Kuang-Chao Chen, Chih-Yuan Lu

Журнал:

IEEE Transactions on Semiconductor Manufacturing

Рік:

2010

Мова:

english

Файл:

PDF, 5.94 MB

english, 2010

[IEEE 2006 International Electron Devices Meeting - San Francisco, CA, USA (2006.12.11-2006.12.13)] 2006 International Electron Devices Meeting - A Multi-Layer Stackable Thin-Film Transistor (TFT) NAND-Type Flash Memory

Lai, Erh-Kun, Lue, Hang-Ting, Hsiao, Yi-Hsuan, Hsieh, Jung-Yu, Lu, Chi-Pin, Wang, Szu-Yu, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Gong, Jeng, Hsieh, Kuang-Yeu, Liu, Rich, Lu, Chih-Yuan

Рік:

2006

Мова:

english

Файл:

PDF, 2.00 MB

english, 2006

[IEEE 2006 International Electron Devices Meeting - San Francisco, CA, USA (2006.12.11-2006.12.13)] 2006 International Electron Devices Meeting - Reliability Model of Bandgap Engineered SONOS (BE-SONOS)

Lue, Hang-Ting, Wang, Szu-Yu, Hsiao, Yi-Hsuan, Lai, Erh-Kun, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Hsieh, Kuang-Yeu, Liu, Rich, Lu, Chih Yuan

Рік:

2006

Мова:

english

Файл:

PDF, 297 KB

english, 2006

[IEEE 2007 IEEE International Electron Devices Meeting - Washington, DC, USA (2007.12.10-2007.12.12)] 2007 IEEE International Electron Devices Meeting - A High-Speed BE-SONOS NAND Flash Utilizing the Field-Enhancement Effect of FinFET

Hsu, Tzu-Hsuan, Lue, Hang-Ting, Lai, Erh-Kun, Hsieh, Jung-Yu, Wang, Szu-Yu, Yang, Ling-Wu, King, Ya-Chin, Yang, Tahone, Chen, Kuang-Chao, Hsieh, Kuang-Yeu, Liu, Rich, Lu, Chih-Yuan

Рік:

2007

Мова:

english

Файл:

PDF, 1.84 MB

english, 2007

[IEEE 2013 e-Manufacturing & Design Collaboration Symposium (eMDC) - Hsinchu, Taiwan (2013.9.6-2013.9.6)] 2013 e-Manufacturing & Design Collaboration Symposium (eMDC) - Detecting buried voids in copper interconnect

Liao, Hsiang-Chou, Tuung Luoh,, Ling-Wu Yang,, Tahone Yang,, Kuang-Chao Chen,, Chih-Yuan Lu,, Steve Lin,, Cheng, Alex, Yao, Ivan, SiYeul Yoon,, Moreau, Olivier, Xiao, Hong

Рік:

2013

Мова:

english

Файл:

PDF, 1.11 MB

english, 2013

Wang, Szu-Yu, Lue, Hang-Ting, Du, Pei-Ying, Liao, Chien-Wei, Lai, Erh-Kun, Lai, Sheng-Chi, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Gong, Jeng

Журнал:

IEEE Transactions on Device and Materials Reliability

Рік:

2008

Мова:

english

Файл:

PDF, 1.47 MB

english, 2008

[IEEE 2010 21st Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - San Francisco, CA, USA (2010.07.11-2010.07.13)] 2010 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Yield enhancement using source/drain BF2+ implant process optimization

Luoh, Tuung, Hsieh, Sheng-Hui, Lee, Chen-Ling, Lee, Hong Ji, Wei, Kuo-Liang, Su, Chin-Ta, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

Рік:

2010

Мова:

english

Файл:

PDF, 384 KB

english, 2010

[IEEE 2012 e-Manufacturing & Design Collaboration Symposium (eMDC) - HsinChu, Taiwan (2012.09.4-2012.09.4)] 2012 e-Manufacturing & Design Collaboration Symposium (eMDC) - Sensitivities improvement by utilizing dark mode of bright filed inspection

Li, Hsiao-Leng, Chung, Yen, Hung, Che-Lung, Luoh, Tuung, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chou, Lu, Chih-Yuan

Рік:

2012

Мова:

english

Файл:

PDF, 403 KB

english, 2012

[IEEE IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Tempe, Arizon, USA (Dec. 5, 2005)] IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - A novel p-channel NAND-type flash memory with 2-bit/cell operation and high programming throughput (<20 MB/sec)

Hang-Ting Lue,, Szu-Yu Wang,, Erh-Kun Lai,, Min-Ta Wu,, Ling-Wu Yang,, Kuang-Chao Chen,, Joseph Ku,, Kuang-Yeu Hsieh,, Liu, R., Chih-Yuan Lu,

Рік:

2005

Мова:

english

Файл:

PDF, 457 KB

english, 2005

[IEEE 2012 e-Manufacturing & Design Collaboration Symposium (eMDC) - HsinChu, Taiwan (2012.09.4-2012.09.4)] 2012 e-Manufacturing & Design Collaboration Symposium (eMDC) - The application of e beam inspection on 3D NAND flash

Liao, Hsiang-Chou, Chen, Yi-Chin, Lee, Guan-Ru, Shih, Yen-Hao, Lue, Hang-Ting, Luoh, Tuung, Yang, Ling-Wu, Hsieh, Kuang-Yeu, Yang, Tahone, Chen, Kuang-Chao, Liu, Rich, Lu, Chih-Yuan

Рік:

2012

Мова:

english

Файл:

PDF, 306 KB

english, 2012

[IEEE 2012 e-Manufacturing & Design Collaboration Symposium (eMDC) - HsinChu, Taiwan (2012.09.4-2012.09.4)] 2012 e-Manufacturing & Design Collaboration Symposium (eMDC) - Optics selection by high magnification optical micrograph in bright field inspection

Chen, Chi-Min, Chen, Yi-Chin, Luoh, Tuung, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

Рік:

2012

Мова:

english

Файл:

PDF, 411 KB

english, 2012

[IEEE 2012 e-Manufacturing & Design Collaboration Symposium (eMDC) - HsinChu, Taiwan (2012.09.4-2012.09.4)] 2012 e-Manufacturing & Design Collaboration Symposium (eMDC) - Dark field inspection technique on poly-silicon CMP process

Chuang, Yen, Hung, Che-Lung, Luoh, Tuung, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chou, Lu, Chih-Yuan

Рік:

2012

Мова:

english

Файл:

PDF, 332 KB

english, 2012

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Performance and reliability optimizations of BE-SONOS NAND Flash using SiON bandgap-tuning tunneling barrier

Liao, Jeng-Hwa, Hsieh, Jung-Yu, Lue, Hang-Ting, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih Yuan

Рік:

2010

Мова:

english

Файл:

PDF, 972 KB

english, 2010

[IEEE 2007 IEEE International Electron Devices Meeting - Washington, DC, USA (2007.12.10-2007.12.12)] 2007 IEEE International Electron Devices Meeting - Study of Local Trapping and STI Edge Effects on Charge-Trapping NAND Flash

Lue, Hang-Ting, Hsu, Tzu-Hsuan, Wang, Szu-Yu, Hsiao, Yi-Hsuan, Lai, Erh-Kun, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Hsieh, Kuang-Yeu, Liu, Rich, Lu, Chih-Yuan

Рік:

2007

Мова:

english

Файл:

PDF, 2.41 MB

english, 2007

[IEEE 2013 e-Manufacturing & Design Collaboration Symposium (eMDC) - Hsinchu, Taiwan (2013.9.6-2013.9.6)] 2013 e-Manufacturing & Design Collaboration Symposium (eMDC) - Quasi-blind voltage contrast in e beam inspection

Hsiang-Chou Liao,, Hsiao-Leng Li,, Tuung Luoh,, Ling-Wu Yang,, Tahone Yang,, Kuang-Chao Chen,, Chih-Yuan Lu,

Рік:

2013

Мова:

english

Файл:

PDF, 1.05 MB

english, 2013

[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Reliability and Processing Effects of Bandgap Engineered SONOS (BE-SONOS) Flash Memory

Wang, Szu-Yu, Lue, Hang-Ting, Lai, Erh-Kun, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Gong, Jeng, Hsieh, Kuang-Yeu, Liu, Rich, Lu, Chih Yuan

Рік:

2007

Мова:

english

Файл:

PDF, 495 KB

english, 2007

[IEEE 2009 IEEE International Electron Devices Meeting (IEDM) - Baltimore, MD, USA (2009.12.7-2009.12.9)] 2009 IEEE International Electron Devices Meeting (IEDM) - Study of sub-30nm thin film transistor (TFT) charge-trapping (CT) devices for 3D NAND flash application

Tzu-Hsuan Hsu,, Lue, Hang-Ting, Chih-Chang Hsieh,, Lai, Erh-Kun, Lu, Chi-Pin, Hong, Shih-Ping, Wu, Ming-Tsung, Hsu, F. H., Lien, N. Z., Hsieh, Jung-Yu, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao,

Рік:

2009

Мова:

english

Файл:

PDF, 904 KB

english, 2009

[IEEE 2007 IEEE Symposium on VLSI Technology - Kyoto, Japan (2007.06.12-2007.06.14)] 2007 IEEE Symposium on VLSI Technology - A Novel Gate-Injection Program/Erase P-Channel NAND-Type Flash Memory with High (10M Cycle) Endurance

Lue, Hang-Ting, Lai, Erh-Kun, Wang, Szu-Yu, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Hsieh, Kuang-Yeu, Liu, Rich, Lu, Chih-Yuan

Рік:

2007

Мова:

english

Файл:

PDF, 1.16 MB

english, 2007

[IEEE 2009 IEEE International Reliability Physics Symposium (IRPS) - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Study of the charge-trapping characteristics of silicon-rich nitride thin films using the gate-sensing and channel-sensing (GSCS) method

Lu, Chi-Pin, Hsieh, Jung-Yu, Du, Pei-Ying, Lue, Hang-Ting, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

Рік:

2009

Мова:

english

Файл:

PDF, 448 KB

english, 2009

[IEEE 2013 e-Manufacturing & Design Collaboration Symposium (eMDC) - Hsinchu, Taiwan (2013.9.6-2013.9.6)] 2013 e-Manufacturing & Design Collaboration Symposium (eMDC) - Inspection flow of yield impacting systematic defects

Chimin Chen,, ChengHua Yang,, Hsiang-Chou Liao,, Tuung Luoh,, Ling-Wu Yang,, Tahone Yang,, Kuang-Chao Chen,, Chih-Yuan Lu,, Donghua Liu,, Jeff Fan,, Rong Lv,

Рік:

2013

Мова:

english

Файл:

PDF, 1.53 MB

english, 2013

[IEEE IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Tempe, Arizon, USA (Dec. 5, 2005)] IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - BE-SONOS: A bandgap engineered SONOS with excellent performance and reliability

Hang-Ting Lue,, Szu-Yu Wang,, Erh-Kun Lai,, Yen-Hao Shih,, Sheng-Chih Lai,, Ling-Wu Yang,, Kuang-Chao Chen,, Ku, J., Kuang-Yeu Hsieh,, Liu, R., Chih-Yuan Lu,

Рік:

2005

Мова:

english

Файл:

PDF, 393 KB

english, 2005

Physical and electrical characteristics of silicon oxynitride films with various refractive indices

Liao, Jeng-Hwa, Hsieh, Jung-Yu, Lin, Hsing-Ju, Tang, Wei-Yao, Chiang, Chun-Ling, Lo, Yun-Shan, Wu, Tai-Bor, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

Журнал:

Journal of Physics D Applied Physics

Рік:

2009

Мова:

english

Файл:

PDF, 1004 KB

english, 2009

[IEEE 2014 20th International Conference on Ion Implantation Technology (IIT) - Portland, OR, USA (2014.6.26-2014.7.4)] 2014 20th International Conference on Ion Implantation Technology (IIT) - Investigation of floating gate depletion effect on NAND FLASH reliability

Jeng-Hwa Liao,, Jung-Yi Guo,, Yu-Min Lin,, Jung-Yu Hsieh,, Ling-Wu Yang,, Tahone Yang,, Kuang-Chao Chen,, Chih-Yuan Lu,

Рік:

2014

Мова:

english

Файл:

PDF, 3.37 MB

english, 2014

ECS Transactions [ECS China Semiconductor Technology International Conference 2011 (CSTIC 2011) - Shanghai, China (March 13 - March 14, 2011)] - Process Optimization of Contact Module in NOR Flash Using High Resolution e-Beam Inspection

Liao, Hsiang C., Hung, Che L., Luoh, Tuung, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

Рік:

2011

Мова:

english

Файл:

PDF, 741 KB

english, 2011

ECS Transactions [ECS China Semiconductor Technology International Conference 2012 (CSTIC 2012) - Shanghai, China (March 18 - March 19, 2012)] - Process Variation Improvement and Stress Analysis of Contact Module

Luoh, Tuung, Liao, Hsiang-Chou, Chen, Po-Chou, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

Рік:

2012

Мова:

english

Файл:

PDF, 700 KB

english, 2012

Comparison of Hand-Assisted Laparoscopic and Open Radical Cystectomy for Bladder Cancer

Wang, Sheng-Zheng, Chen, Ling-Wu, Zhang, Yong-Hai, Wang, Wen-Wei, Chen, Wei, Lin, Huan-Yi

Журнал:

Urologia Internationalis

Рік:

2010

Мова:

english

Файл:

PDF, 122 KB

english, 2010

ECS Transactions [ECS China Semiconductor Technology International Conference 2011 (CSTIC 2011) - Shanghai, China (March 13 - March 14, 2011)] - Verification of Systematic Defects Using e-Beam Defect Review System

Luoh, Tuung, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

Рік:

2011

Мова:

english

Файл:

PDF, 960 KB

english, 2011

The prognostic value of hydronephrosis in bladder cancer treated by radical cystectomy

Lin, Huan-yi, Wang, Sheng-zheng, Chen, Jun-xing, Chen, Ling-wu, Xiao, Jun

Журнал:

Rivista Urologia

Рік:

2011

Мова:

english

Файл:

PDF, 154 KB

english, 2011

ECS Transactions [ECS China Semiconductor Technology International Conference 2012 (CSTIC 2012) - Shanghai, China (March 18 - March 19, 2012)] - Advanced Inspection Technique for High Aspect Ratio Contact Holes Using e Beam Scan and Voltage Cap in SEM Review

Liao, Hsiang-Chou, Hung, Che-Lun, Luoh, Tuung, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

Рік:

2012

Мова:

english

Файл:

PDF, 518 KB

english, 2012

[IEEE 2015 China Semiconductor Technology International Conference (CSTIC) - Shanghai, China (2015.3.15-2015.3.16)] 2015 China Semiconductor Technology International Conference - The new methodology of contact process window vericification

Fang, Yi-Lung, Li, Siao-Ling, Liao, Hsiang-Chou, Luoh, Tuung, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao

Рік:

2015

Мова:

english

Файл:

PDF, 932 KB

english, 2015

[IEEE 2014 20th International Conference on Ion Implantation Technology (IIT) - Portland, OR, USA (2014.6.26-2014.7.4)] 2014 20th International Conference on Ion Implantation Technology (IIT) - Study on the improved thermal stability of cobalt silicide film by using cryogenic carbon PAI

Jung-Yi Guo,, Jeng-Hwa Liao,, Yu-Min Lin,, Chun-Min Cheng,, Jung-Yu Hsieh,, Ling-Wu Yang,, Tahone Yang,, Kuang-Chao Chen,, Chih-Yuan Lu,

Рік:

2014

Мова:

english

Файл:

PDF, 393 KB

english, 2014

[IEEE 2016 21st International Conference on Ion Implantation Technology (IIT) - Tainan, Taiwan (2016.9.26-2016.9.30)] 2016 21st International Conference on Ion Implantation Technology (IIT) - Investigation of Floating Gate Implantation Effect on 1Xnm NAND FLASH

Liao, Jeng-Hwa, Ko, Zong-Jie, Lin, Hsing-Ju, Hsieh, Jung-Yu, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

Рік:

2016

Мова:

english

Файл:

PDF, 1.09 MB

english, 2016